Workshops

Description: Starting from basics of digital imaging theory through to automation of analysis code this workshop has something for everyone. The first day begins with simple area and volume measurements, progresses through to object segmentation and counting and finishes with AI and machine learning approaches. The second day builds on the fundamentals of the first with attendees learning to code and automate complex analysis for many images or large data sets.

Audience: Beginners through to advanced imaging users. The majority of examples used will be biologically based but the principals learnt can be applied to other images just as easily.

Notes: Bring own laptop with power adapter. Have Fiji installed (specific instructions will be provided to those that register). Watch a 1 hour lecture on digital imaging theory before hand (link will be provided to those that register).

Description: The workshop will cover basic theoretical and practical aspects of 3D electron diffraction technique (3D-ED / microED) and its application to structure determination of nano/microcrystalline materials of different classes – from inorganic, to organic and biological compounds. The workshop will include lectures and tutorials demonstrating the use of electron diffraction data for structure analysis.

 Topics covered:

• Theoretical background of electron diffraction
• Sample preparation methods for 3D-ED: from inorganics to proteins
• Data collection of 3D-ED data: introduction to the instruments
• 3D-ED data processing
• Structure solution and refinement of small molecules and macromolecules
• Dynamical refinement
• History & Perspectives of 3D-ED

Audience: Beginners, new to the field of diffraction or MicroED

Notes: Attendees will need to bring a laptop. Further instructions will be sent to registrants closer to the workshop.  

Description: This will be an in-person full day workshop for beginners that will be partitioned into two half-day sessions. The morning session will comprise a series of lectures focussing on the theory and practical applications of cryo-electron tomography in the biological sciences. The lectures will touch on cryo-ET of recombinant/purified protein complexes, in situ cryo-tomography and sub-tomogram averaging, as well as practical considerations of data acquisition and reconstruction pipelines. The afternoon session will include a hands-on practical course covering the use of etomo (IMOD) for the reconstruction of cryo-tilt series. There will be a short introduction at the start the day and a wrap up at the end.

Audience: Beginners interested in Cryo-ET. Microscopists; Structural Biologists; Cell Biologists.

Notes: The attendees will be required to bring a laptop capable of running IMOD (pre-installed, details to be sent to confirmed registrants) with 150 Gb hard drive space. If they do not have a laptop capable of this, please let the organisers know and we can arrange access to a computer. The organisers will provide the cryo-tilt series data for the practical e-tomo course for registered attendees closer to the date of the workshop.

Description: This one-day workshop will introduce the operating principles and applications of three types of imaging mass-spectrometry techniques. The techniques covered are Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS), Large Geometry-SIMS (LG-SIMS, including NanoSIMS) and Atom Probe Tomography (APT).

The workshop will include a laboratory tour of the John de Laeter Centre.

Audience: The organisers encourage people new to the field as well as experienced SIMS users to attend.

Notes: Closed shoes required (for lab tour).

Description: The workshop will cover the basics of EBSD analysis and aims to provide a more advanced insight of the application of EBSD as a research tool across multiple disciplines for academic and industry-related research. The workshop will highlight practical approaches to data acquisition and Applications include established fields in materials and geo-sciences as well as emerging new fields, e.g. 3D printing. 

Audience: Beginners and more advanced users of technique.

Description: This workshop will describe two Monte Carlo simulations softwares, CASINO and Mc-X-Ray, for electron trajectories to simulate BSE and X-ray generated and detected signals in electron microscopy of bilk specimens and also for transparent specimens in STEM where bright and dark field images modes will be covered. Emphasis will be given on applications exemples and also how to use these programs with demo exemples that will be performed on-site. 

Audience: Beginners and advanced users are welcome

Notes: Attendees must bring a laptop.

Description: The workshop will begin at an introductory level with energy dispersive x-ray spectrometry (EDS) on Scanning Electron Microscopes (SEM) and also cover basics and some more advanced aspects of electron probe microanalysis (EPMA)/wavelength dispersive x-ray spectrometry (WDS), x-ray mapping, and SEM-based automated mineralogy.

Audience: Beginners and more advanced users of the technique.

Description: The workshop will cover the basic operating principles and applications of Focused Ion Beam Scanning Electron Microscopy (FIB-SEM). Applications covered include nanofabrication, site specific sample preparation, 3D slice and view, and FIB-based Time of Flight-Secondary Ion Mass Spectrometry (FIB-ToF-SIMS). The content will be delivered as lectures and laboratory demonstrations. The demonstrations will be conducted in the John de Later Centre on a Lyra3 FIB (equipped with EDS, EBSD and ToF-SIMS).

Audience: All levels of researchers and industry participants. The focus will be mostly technical.

Notes: Participants are welcome to bring their own samples/data for discussion. Closed shoes required (for lab demonstrations).

Description: The ZEISS Lattice Lightsheet 7 workshop will provide an introduction to lattice lightsheet technology, and give an overview of the core imaging performance of the instrument. Lattice Lightsheet is a very gentle, fast volume imaging technique, and the ZEISS implementation enables biologists to use their traditional sample preparation techniques and sample holders for studying highly dynamic biological behaviour. The workshop will introduce participants to the outstanding imaging performance, with a focus on fast volume imaging. Single channel and dual channel images can be acquired, and processed accordingly. A discussion considering the processing steps associated with Lattice Lightsheet, such as deskewing, will also take place. Finally, a range of possible applications can be outlined that gives participants an idea of how useful the ZEISS Lattice Lightsheet 7 would be in their facility.

Audience: Central imaging facility managers and all microscopy users. 

Notes: Closed shoes required (for lab demonstrations).

Description: The workshop will include:

• An introduction to cryoEM
• Methods & applications
• Camera options
• Advanced methods of operation
• Q&A
• Instrument demonstrations @ CMCA

Audience: Anyone with an interest in cryo-electron microscopy.

Notes: Closed shoes required (for lab demonstrations).

Description: The workshop will include:

• Special features of the F200 TEM
• Advanced applications
• Operation & techniques
• Q&A
• Instrument demonstrations @ CMCA

Audience: Anyone with an interest in using TEM for Materials Science. 

Notes: Closed shoes required (for lab demonstrations).

Description: The workshop will include:

• Introduction to Field Emission EPMA
• Advanced applications
• Operation & techniques
• An introduction to the IHP200F
• Q&A
• Instrument demonstrations @ CMCA

Audience: Anyone with an interest in EPMA and/or geoscience analytical methods.

Notes: Closed shoes required (for lab demonstrations).

Description: More than ever, modern manufacturing necessitates reliable, quality components. The next-generation Phenom XL G2 Desktop is a multi-purpose desktop SEM capable of observing large samples up to 100 mm x 100 mm. With fully integrated x-ray analysis (EDS) and fastest time to imaging (<60sec) the Phenom SEM is easy to use and suitable for investigating micron and submicron structures in high resolution. Using dedicated automation software, the Phenom ParticleX Desktop SEM is designed to meet quality control and assurance demands for a range of industries including additive manufacturing, steel, battery and cleanliness analysis. This workshop will include instrument demonstrations followed by additional “hands on” time for sample analysis.

Audience: Anyone with an interest in desktop SEMs.

Notes: Closed shoes required (lab demonstrations).

For Bookings: 0.5-1 hour instrument demonstration sessions are available throughout the day. Bookings are preferred but not essential. Contact David Myint (dmyint@atascientific.com.au or Mobile: +61 (0)448 086 569) to register your interest or to book your preferred timeslot (NOTE: you do not need to enrol through the workshop portal for this workshop).

Description: We are inviting everyone with an interest in TEM techniques and applications to attend this workshop, in which we will explain TESCAN’s approach to the design of our first commercial TEM solution.  As a newcomer to the TEM market, we had an advantage of designing a TEM solution from a blank sheet of paper, not hindered by limitations imposed by legacy architecural designs, taking a different approach compared to traditional TEM suppliers. We chose to develop a STEM from the ground up, taking recent innovations in direct electron detection central to a design that basically produced the world’s first diffraction scanning transmission electron microscope, with fully automated column adjustments and alignments.  Integration of components such as electron beam precession, EDS acquisition and beam blanking, were guided by not compromising the performance of the direct electron diffraction camera at any circumstance.

In the workshop, we will discuss 4 themes:

• Explain TESCAN’s vision behind the design of a truly innovative Diffraction Microscope.
• Discuss 4D-STEM and its applications in the field of engineered nanomaterials.
• Elaborate on the performance benefits from fast and precise synchronisation between scanning and diffraction imaging, EDS acquisition, electron beam precession and fast beam blanking (and near-UHV engineering of the column components).
• Demonstrate the benefits of a column designed for fully automated adjustments and alignments, to allow access to a high-performance STEM system without weeks, if not months, of prior training and precious beam time spent on interacting with the optics, instead of your sample.

Presenters:
Petr Mareš, TESCAN TENSOR Product Manager
Dirk van der Wal, TESCAN Chief Marketing Officer

Audience: Anyone interested in TEM